Microscopes


Arm200


The Innovative Electron Microscopy group at the INM – Leibniz Institute for New Materials operates a high-resolution transmission electron microscope (TEM, ARM200F, JEOL) with scanning TEM (STEM) mode and spherical aberration corrector of the STEM probe (CEOS). The system includes a combined energy filter and an electron energy loss analyzer (EELS, Gatan), and is also equipped with an energy dispersed X-ray analysis (EDX) system (JEOL). The microscope has a cold field emission source so that a low energy spread of 0.3 eV can be achieved. The microscope combines a spot size of 0.08 nm with a probe current of 200 pA.

For the acquisition of three-dimensional (3D) information, it has a high tilt holder, and software for STEM and TEM tomography (Gatan).

Unique is the capability to study samples in liquid using a special sample holder (we operate the Poseidon system of Protochips, and also the Ocean system of DENS Solutions).

The microscope is available for research projects of all groups at the INM. We also accomodate various external projects, for example, with researchers at the the Saarland University.


ESEM


Our group runs an environmental scanning electron microscope (ESEM, QUANTA 250 FEG, FEI). The instrument is a scanning electron microscope with a Schottky emitter for examinations in a high vacuum (<10-5 Pa), low vacuum (up to 200 Pa) and ESEM (up to 2000 Pa) mode. Gaseous secondary-electron detector, backscattered-electron detector, and STEM detector for all vacuum modes. The system also includes a peltier stage for cooling the sample to image samples in a thin layer of water compatible with STEM detection.


Fluorescence microscope


Our lab houses a fluorescence mciroscope (DMI6000B, Leica). It is a fully motorized inverted fluorescence and interference contrast microscope including high-resolution water immersion- and oil lenses, high speed operation, continuous autofocus, cell incubator for live cell imaging, micromanipulator and injector, software for time-resolved imaging, and 3D imaging including deconvolution.